High Voltage Electron Microscopy at Berkeley

The Critical Voltage Effect in High-Voltage Electron' Microscopy

High-voltage electron microscopy of normal human cornea.

Conventional transmission electron microscopy (CTEM) was compared with high-voltage electron microscopy (HVEM) on 11 normal human corneas (age range, 30 weeks of gestation to 92 yr). Epithelial anchoring fibrils were noted between the basal epithelial cells and Bowman's layer (BL) as previously reported. Parallel pairs of fibers, 27.5 nm in diameter, were observed crossing into the anterior str...

Scanning transmission electron microscopy at high resolution.

We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 ...

Electron Microscopy at Very High Resolution

Transmission electron microscopy (TEM) is one of the most frequently used tools for the characterization of nanomaterials. Aberration-correction has revolutionized the field of electron microscopy and now equipment is commercially available providing sub-Gngström resolution and single atom sensitivity for atomic, electronic, and chemical structure analyses. In this entry, aberration-corrected s...

Electron Microscopy at Scale

The essential details of cellular interactions at synaptic level in the brain are still largely unknown. In this issue, Kasthuri et al. report new experimental and computational technologies for large-scale electron microscopy data collection and analysis, and through saturated reconstruction uncover synaptic connectional specificity that cannot be predicted by simple axonal-dendritic proximity.